Compensating force baseline artifacts in a capacit

专利名称：Compensating force baseline artifacts in a

capacitive sensor

发明人：Shubha Ramakrishnan,Adam L. Schwartz申请号：US15199421申请日：20160630公开号：US10394393B2公开日：20190827

专利附图：

摘要：An example processing system for a capacitive input device includes sensorcircuitry configured to drive a plurality of sensor electrodes with capacitive sensingsignals over time to acquire capacitive values of a plurality of capacitive frames. The

processing system includes a determination module configured to analyze a firstcapacitive frame of the plurality of capacitive frames to identify a force event bydetecting that a rate of change of a first capacitive value in the first capacitive frameexceeds a first threshold. The determination module is configured to determine a changein capacitance between the first capacitive value and a baseline value, and analyze asecond capacitive frame of the plurality of capacitive frames acquired after the forceevent to adjust the baseline value responsive to a difference between the baseline valueand a second capacitive value in the second capacitive frame falling below a secondthreshold.

申请人：SYNAPTICS INCORPORATED

地址：San Jose CA US

国籍：US

代理机构：Paradice and Li LLP

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