专利名称：ESD TESTING STRUCTURE, METHOD OF
USING SAME AND METHOD OF FORMINGSAME
发明人：Tzu-Heng CHANG,Jen-Chou TSENG,Ming-Hsiang SONG
申请号：US15274356申请日：20160923
公开号：US20180088163A1公开日：20180329
专利附图：
摘要：An electrostatic discharge (ESD) testing structure includes a measurement
device in a first die. The ESD testing structure further includes a fuse in a second die. TheESD testing structure further includes a plurality of bonds electrically connecting the firstdie to the second die, wherein a first bond of the plurality of bonds electrically connectsthe fuse to the measurement device.
申请人：TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
地址：Hsinchu TW
国籍：TW
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