专利名称:LEAKAGE CURRENT COMPENSATION
CIRCUIT
发明人:Chee Weng Cheong,Yannick Guedon申请号:US13339715申请日:20111229
公开号:US20130169295A1公开日:20130704
专利附图:
摘要:Circuitry is described for compensating leakage currents in capacitive sensingcircuits. A single active leakage compensation circuit may sense a representative leakagecurrent and drive a plurality of output transistors, each of which provides a compensating
current to a respective capacitive sensing circuit. The leakage compensation circuit maysense current flow through a device substantially equivalent to a device exhibitingleakage current in a capacitive sensing circuit, and in response, provide a signal to driveone or more output transistors to supply approximately equivalent currents to aplurality of circuit nodes. For embodiments having multiple similar capacitive sensors andcapacitive sensing circuits, only one transistor need be added to each capacitive sensingcircuit to compensate for leakage current.
申请人:Chee Weng Cheong,Yannick Guedon
地址:Singapore SG,Mimosa Park SG
国籍:SG,SG
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