专利名称:Memory management method, memory
storage device and memory control circuitunit
发明人:Hiroshi Watanabe申请号:US14934154申请日:20151106公开号:US09418731B1公开日:20160816
专利附图:
摘要:A memory management method, a memory storage device and a memorycontrol circuit unit are provided. The method comprises: obtaining a first threshold
voltage distribution of memory cells; grouping the first threshold voltage distribution toa plurality of first threshold voltage groups; obtaining a second threshold voltagedistribution of the memory cells; grouping the second threshold voltage distribution to aplurality of second threshold voltage groups; allocating a memory cell among thememory cells to a virtual block if a threshold voltage pair of the memory cell belongs toa specific group of the first threshold voltage groups and a specific group of the secondthreshold voltage groups, such that the first memory cell is operated under a specific-level cell mode. Accordingly, the reliability of memory cells may be improved withoutsignificantly sacrificing the capacity of the rewritable non-volatile memory module.
申请人:PHISON ELECTRONICS CORP.
地址:Miaoli TW
国籍:TW
代理机构:Jianq Chyun IP Office
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