Programmable logic device and method of testing a

专利名称：Programmable logic device and method of

testing a programmable logic device

发明人：Graham McKenzie,Joel A. Seely申请号：US10923527申请日：20040820公开号：US07089140B1公开日：20060808

专利附图：

摘要：A programmable logic device includes a functional block, which does not formpart of an embedded processor, which can perform a testing function on other functionalblocks of the programmable logic device. Thus, the test block can read stored data

values from registers in the other functional blocks of the programmable logic device, orcan read signal values at points in the other functional blocks of the programmable logicdevice, or can insert specific data values in registers in the other functional blocks of theprogrammable logic device.

申请人：Graham McKenzie,Joel A. Seely

地址：Kirby Muxloe GB,Santa Cruz CA US

国籍：GB,US

代理机构：Townsend and Townsend and Crew LLP

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